fault coverage造句
例句与造句
- As an enhancement of these methods , current testing can increase the fault coverage and make higher the reliability of ics
作为这些方法的一个补充，电流测试方法能够提高故障的覆盖率，提高产品的可靠性。 - And , when coupled with functional testing , the fault coverage for the entire process is as good as or better than in - circuit testing alone
加上功能测试，这个过程中检测到的故障率要比单独进行在线测试故障发现率大。 - The transient power supply current ( iddt ) testing can detect some faults undetectable by any other test method , and increase fault coverage
瞬态电流测试方法可以测试一些其他测试方法无法检测的故障，进一步提高故障覆盖率。 - Through the simulative experiments about iddq detecting bridge faults in cmos and bicmos circuits , the fault coverage of iddq can be estimated
并对cmos电路与bicmos电路的桥接故障作了iddq检测仿真实验,分析了iddq检测的故障覆盖率。 - In this paper we use the bist in the testing of the ssrams in estarl according to the characteristics of the structure and get almost 100 % fault coverage
本文针对estar1内部ssram的结构特点，实现了存储器自测试，得到了将近100的故障覆盖率。 - It's difficult to find fault coverage in a sentence. 用fault coverage造句挺难的
- Because most of the faults found at board test are manufacturing defects , fault coverage for mda tests is nearly as good as fault coverage for in - circuit tests
因为在板级测试中发现的大部分故障都是生产缺陷，生产缺陷分析测试到的故障几乎都可以覆盖在线测试所发现的问题。 - The conclusion is that by using ant algorithm , the fault coverage about near half standard circuits is best ; and the generation speed is very higher than strategate ' s
与现有测试生成器相比，基于蚂蚁算法的测试矢量生成结果中，有近一半的标准电路获得了最高的故障覆盖率；在生成速度方面远高于strategate等算法。 - The dynamic power supply current ( iddt ) is a new window through which we can observe the switching activities in digital circuits . iddt testing methods make possible further increasing the fault coverage
动态电流提供了一个观测电路内部开关性能的新的窗口，动态电流测试方法为进一步提高故障覆盖率提供了可能。 - The experimental results illuminate the hierarchical test generation algorithm can greatly decrease the scale of test sets ( about 66 % ) , but the fault coverage and time performance are lower than gate - level test generation
实验数据表明分层测试产生算法能大大压缩电路测试集（约为66 ） ，而故障覆盖率有略微下降，时间性能也有些许降低。 - These new methods adopt the circuit information contained in the power supply line current to realize the fault diagnosis . it can increase the fault coverage , reduce testing cost and improve the quality and reliability of ics
它通过从电源电流信号中提取有效的信息来进行故障诊断,能够提高故障覆盖率,降低测试成本并提高集成电路产品的质量与可靠性。 - In this paper we investigate and carry out boundary scan ^ internal scan and built - in self - test three dft technologies in the embedded microprocessor estarl and get satisfying result , the fault coverage is more than 96 %
本文针对嵌入式微处理器estar1的结构特点，研究并实现了边界扫描、内部全扫描和内建自测试三种可测性设计技术，取得了良好的效果，故障覆盖率达到96以上。 - The results through evaluating the scheme show that under the condition of ensuring high fault coverage , the scheme not only decreases the number of the test vectors by applying an universal test set , but substantially thrifts the extra hardware overhead
经过方案评估得出此方案在不降低故障检测覆盖率的情况下，既使用通用测试集，又减少测试矢量数，还大大节约了附加硬件开销。 - The stuck - open fault is simulated concurrently using iddt testing with the test pattern pairs generated above . through detaching a pattern pair into two independent patterns , the stuck - at fault are simulated concurrently . simulation results show better fault coverage . the
最后,针对iddt测试的可行性,我们通过利用pspice软件对s208电路中的一些故障做了模拟,这些故障包括开路故障和延时故障。 - Internal scan is advanced for the difficulty of fixing the state of sequential circuit , can be divided into full - scan and partial - scan . in this paper we use full - scan according to the real circumstance of estarl and get high fault coverage with very little impact on the circuit
本文根据estar1的实际情况，设计实现了全扫描结构，既得到了较高的故障覆盖率，又对电路的延迟和芯片面积影响很小(延迟时间增加0 . 3 ，芯片面积增加0 . 01 ) 。 - Jx5 is a complex microprocessor , which contains cache , microcode rom , instruction prefetch unit , instruction decode unit , integer unit , mmx unit , floating point unit , page unit , bus unit , dp logic , apic and so on . it is very difficulty to test a such complicated microprocessor and receive anticipative fault coverage ratio . so , we must add dft in cpu ’ design
Jx5微处理器是一款结构异常复杂的微处理器,它的内部包含有: cache 、微码rom 、指令预取部件和动态分支预测部件、指令译码部件、整数部件、多媒体部件、浮点部件、分段和分页部件、总线接口部件、双处理器接口部件、可编程中断控制部件等。
更多例句： 下一页